Bayesian Estimation of Defects based on Defect Decay Model: BayesED3M

نویسندگان

  • Syed Waseem Haider
  • João W. Cangussu
چکیده

The estimation of the total number of defects at early stages of the testing process helps managers to make resource allocation and deadline decisions. The use of nonbayesian approaches has proven to be accurate but presents a certain latency to achieve a reasonable accuracy. Here we describe BayesED3M , a bayesian estimator construct upon an existing MLE (Maximum Likelihood Estimator) named as ED3M . The case studies presented in this paper show that BayesED3M outperforms ED3M whenever reasonable historical data is available.

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تاریخ انتشار 2006